Библиографическая ссылка на патент
Pat. 10003260 United States, Int. Cl.22 G06F 9/22, H02M 1/38, H02M 3/156, H02M 3/158, H03K 17/16, H03K 17/284, H02M 1/08. Semiconductor devices and methods for dead time optimization by measuring gate driver response time : Appl. N 14/747981 : Filed 23.06.2015 : Pub. 19.06.2018 : / Dirk Rowald, Hubert M. Bode ; Assignee Nxp Usa Inc ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US10003260/en?oq=US10003260.html (дата обращения: ДД.ММ.ГГГГ).