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Pat. 10069490 United States, Int. Cl.22 H03K 3/017, G05F 1/10, G06F 1/26, H02M 3/158, H03K 5/003, H03K 5/156, H02M 3/156. Method, apparatus and system for voltage compensation in a semiconductor wafer : Appl. N 15/013956 : Filed 02.02.2016 : Pub. 04.09.2018 : / Sukeshwar Kannan, Luke England, Mehdi Sadi ; Assignee Globalfoundries Inc ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US10069490/en?oq=US10069490.html (дата обращения: ДД.ММ.ГГГГ).