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Pat. 10345360 United States, Int. Cl.22 G01R 31/02, G01R 31/01, H02M 1/00, H02M 1/32, H02M 1/42, H02M 3/335. Capacitor life diagnosis device, capacitor life diagnosis method, and program : Appl. N 15/162966 : Filed 24.05.2016 : Pub. 09.07.2019 : / Hiroshi Nakao, Yu Yonezawa, Takahiko Sugawara, Yoshiyasu Nakashima ; Assignee Fujitsu Ltd ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US10345360/en?oq=US10345360.html (дата обращения: ДД.ММ.ГГГГ).