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Pat. 10436844 United States, Int. Cl.22 G01R 31/333, G01R 31/327, G01R 31/42, H02J 3/18, H02M 3/158, H02M 7/483. Synthetic test circuit for testing submodule performance in power compensator and test method thereof : Appl. N 15/683544 : Filed 22.08.2017 : Pub. 08.10.2019 : / Yong Ho Chung, Seung Taek Baek, Young Woo Kim, Jin Hee Lee, Eui Cheol Nho, Jae Hun Jung ; Assignee Lsis Co Ltd ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US10436844/en?oq=US10436844.html (дата обращения: ДД.ММ.ГГГГ).