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Pat. 10598713 United States, Int. Cl.22 G01R 31/00, G01R 31/28, G05F 3/20, H01L 27/02, H02H 9/04, H02M 3/07. ESD failure early warning circuit for integrated circuit : Appl. N 15/556685 : Filed 29.11.2016 : Pub. 24.03.2020 : / Yiqiang Chen, Ang Li, Dengyun Lei, Yunfei En, Lichao Hao, Wenxiao Fang, Bo Hou ; Assignee Fifth Electronics Research Institute of Ministry of Industry and Information Technology ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US10598713/en?oq=US10598713.html (дата обращения: ДД.ММ.ГГГГ).