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Pat. 10797535 United States, Int. Cl.22 H02J 50/60, H02J 50/12, H02J 50/70, H02M 3/156, H02M 3/158. Q-factor measurement : Appl. N 16/154665 : Filed 08.10.2018 : Pub. 06.10.2020 : / Nicholaus Smith, Stefan Maireanu, Haiwen Jiang, David Wilson ; Assignee Integrated Device Technology Inc ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US10797535/en?oq=US10797535.html (дата обращения: ДД.ММ.ГГГГ).