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Pat. 10890493 United States, Int. Cl.22 H02M 7/539, G01K 7/01, G01K 13/00, G01R 19/00, H02M 1/08, H02M 7/5387, G01R 15/20, H02M 1/00, H02M 1/32, H02P 27/06. Systems and methods for measuring transistor junction temperature while operating : Appl. N 15/896289 : Filed 14.02.2018 : Pub. 12.01.2021 : / Hui Bo Sun, Jia Zhao ; Assignee Infineon Technologies Ag ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US10890493/en?oq=US10890493.html (дата обращения: ДД.ММ.ГГГГ).