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Pat. 11057031 United States, Int. Cl.22 H02M 1/36, H02M 1/08, H02M 3/07, H03K 17/06, H03K 17/22. Reliability in start up sequence for D-mode power FET driver : Appl. N 16/992003 : Filed 12.08.2020 : Pub. 06.07.2021 : / Arezu Bagheri, Buddhika Abesingha, Ronald E. Reedy ; Assignee Psemi Corp ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US11057031/en?oq=US11057031.html (дата обращения: ДД.ММ.ГГГГ).