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Pat. 11162993 United States, Int. Cl.22 G01R 29/08, G01R 29/00, G01R 29/26, H02M 1/00, H02M 7/217, H02M 7/537. Evaluation method, combined evaluation method, evaluation apparatus, and combined evaluation apparatus : Appl. N 16/261497 : Filed 29.01.2019 : Pub. 02.11.2021 : / Hiroki Katsumata, Michio Tamate, Miwako Fujita, Tamiko Asano, Yuhei Suzuki, Takashi Kaimi, Yuta Sunasaka, Tadanori Yamada, Ryu Araki, Bao Cong Hiu ; Assignee Fuji Electric Co Ltd ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US11162993/en?oq=US11162993.html (дата обращения: ДД.ММ.ГГГГ).