Библиографическая ссылка на патент
Pat. 11476760 United States, Int. Cl.22 H02M 3/158, H02M 1/08, H02M 3/157. Semiconductor process variation detector : Appl. N 16/927558 : Filed 13.07.2020 : Pub. 18.10.2022 : / Robert Allan Neidorff, Saurav Bandyopadhyay, Ramanathan Ramani ; Assignee Texas Instruments Inc ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US11476760/en?oq=US11476760.html (дата обращения: ДД.ММ.ГГГГ).