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Pat. 9935577 United States, Int. Cl.22 H02P 29/024, H01L 23/36, H01L 27/02, H01L 27/06, H01L 29/739, H01L 29/866, H02M 7/537, H02P 27/08, H03K 19/0185, G01R 31/30, H01L 23/373, H02M 1/32, H02M 7/5387. Semiconductor device and fault detecting method : Appl. N 15/098052 : Filed 13.04.2016 : Pub. 03.04.2018 : / Katsutoshi Bito, Daisuke Iijima, Yuji Takehara ; Assignee Renesas Electronics Corp ; NN p. : patents.google.com : URL: https://patents.google.com/patent/US9935577/en?oq=US9935577.html (дата обращения: ДД.ММ.ГГГГ).