Патент США № | 10107904 |
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Автор(ы) | Reis и др. |
Дата выдачи | 23 октября 2018 г. |
X-band and P-band synthetic aperture radars are used to simultaneously gather swaths of reflected radar data over a specific area simultaneously. The P-band is used to penetrate surface clutter that may be on the top of an ice formation as well as to penetrate an ice mass. X-band is used to map surface clutter on the top of an ice formation as well as to map the top of snow that may appear on an ice formation. Digital elevation maps of the top of the snow or ice clutter, the top of the ice, and the bottom of the ice and or ice thickness are constructed. By summing these various digital elevation maps a measurement of the thickness of sea ice can be determined. Further analysis of DEM, MAG and CRV layers provides an indication of the quality of the ice, for example cracks and pressure ridges, and its weak points.
Авторы: | James J. Reis (New Market, MD), Carl Sonnier (Lafayette, LA), Joe Jones (Hagerstown, MD), Mark L. Sanford (Chambersburg, PA), Edward Saade (Frederick, MD) | ||||||||||
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Патентообладатель: |
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Заявитель: | Fugro N.V. (NL) |
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ID семейства патентов | 50186783 | ||||||||||
Номер заявки: | 13/961,567 | ||||||||||
Дата регистрации: | 07 августа 2013 г. |
Document Identifier | Publication Date | |
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US 20140062764 A1 | Mar 6, 2014 | |
Application Number | Filing Date | Patent Number | Issue Date | ||
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61696626 | Sep 4, 2012 | ||||
Класс патентной классификации США: | 1/1 |
Класс совместной патентной классификации: | G01S 13/9023 (20130101); G01S 13/904 (20190501); G01S 13/9076 (20190501) |
Класс международной патентной классификации (МПК): | G01S 13/90 (20060101) |
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