Патент США № | 9971030 |
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Автор(ы) | Jung и др. |
Дата выдачи | 15 мая 2018 г. |
An apparatus and method for correcting the ionospheric distortion of an SAR (Synthetic Aperture Radar) interferogram are disclosed herein. The apparatus includes a multiple aperture SAR interferometry (MAI) interferogram generation unit, a transformed MAI interferogram generation unit, an ionospheric distortion interferogram generation unit, and a corrected SAR interferogram acquisition unit. The multiple aperture SAR interferometry (MAI) interferogram generation unit generates a multiple aperture SAR interferometry (MAI) interferogram using an SAR interferogram. The transformed MAI interferogram generation unit generates a transformed MAI interferogram representative of the azimuth direction derivatives of ionospheric distortion phases using the phases of the MAI interferogram. The ionospheric distortion interferogram generation unit generates an ionospheric distortion interferogram using the transformed MAI interferogram. The corrected SAR interferogram acquisition unit acquires a corrected SAR interferogram by eliminating the generated ionospheric distortion interferogram from the SAR interferogram.
Авторы: | Hyung Sup Jung (Seoul, KR), Dong Taek Lee (Gyeonggi-Do, KR), Zhong Lu (Vancouver, WA), Joong Sun Won (Gyeonggi-Do, KR), Young Jin Park (Seoul, KR), Jae Won Choi (Seoul, KR), Shin Hoi Goo (Seou, KR) | ||||||||||
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Патентообладатель: |
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Заявитель: | University of Seoul Industry Cooperation Foundation (Seoul, KR) Republic of Korea (National Disaster Management Institute) (Seoul, KR) |
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ID семейства патентов | 51021563 | ||||||||||
Номер заявки: | 14/754,291 | ||||||||||
Дата регистрации: | 29 июня 2015 г. |
Document Identifier | Publication Date | |
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US 20150369913 A1 | Dec 24, 2015 | |
Application Number | Filing Date | Patent Number | Issue Date | ||
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PCT/KR2013/009273 | Oct 17, 2013 | ||||
Dec 28, 2012 [KR] | 10-2012-0156644 | |||
Класс патентной классификации США: | 1/1 |
Класс совместной патентной классификации: | G01S 13/9023 (20130101) |
Класс международной патентной классификации (МПК): | G01S 13/90 (20060101) |
Область поиска: | ;342/25C |
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Lee, Dong Taek, Ionospheric Effect Correction of SAR Interferogram using Multiple Aperture SAR Interferometry (MAI), Univ. Seoul Masters Thesis (Feb. 29, 2012) English Abstract, pp. 1-91. cited by applicant. |